Short Course - AIVELA_2020

Rome, 23 - 26 June 2020
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A one-day tutorial course will be held the day before the Conference to provide the fundamentals
of vibration measurements by optical techniques.

The course will include:
- morning theoretical lectures on innovations in Laser Doppler Vibrometry and imaged-based vibration measurements
- afternoon hands-on lab sessions organised in collaboration with leading companies in the field.


Prof. Christian Rembe, Clausthal University of Technology, Germany

Christian Rembe received the diploma in Physics from the University of Hanover, Germany, in 1994. From 1994 to 1999, he was a PhD student at the University of Um in Germany where he earned a doctor degree in Electrical Engineering. In 1999 he joined the Berkeley Sensor & Actuator Center at the University of California, Berkeley as postdoctoral, research engineer with support of a Feodor-Lynen-Scholarship of the Alexander von Humboldt-Foundation and a UC Berkeley MacKay-Lecturer Fellowship. From 2001-2014 he was the manager of the Development Optics group at the Polytec GmbH in Waldbronn, Germany. Since 2015, he is professor for Applied Metrology at the Clausthal University of Technology in Germany. His interests are optics, optical measurement techniques, sensors, and MEMS.

Dr Pascal Lava, MatchID, Belgium

In June 2002 Pascal Lava obtained a master degree in mathematics at Ghent University, followed by a PhD in sciences - nuclear physics at Ghent University in 2006. Since January 2008, he worked as a professor at the department MTM at Leuven University. His research topics included uncertainty quantification in DIC, performance comparison of local and global methods, and material identification via virtual fields methods. Pascal Lava is author of more than 40 peer-reviewed journal papers and co-founder of the DIC platform MatchID. Currently, he is fully employed as CTO within MatchID with a specific focus on training, the use of DIC to calibrate material models and validate FEA simulations. Pascal Lava has led numerous short courses (SEM/IDICS/BSSM) and organized 7 full one-week international DIC master classes (Ghent and Philadelphia); training more than 200 DIC practitioners of the future. His personal drive is to improve the general knowledge about DIC and its involved error sources – increasing the technique’s range of credibility and applicability. Pascal is a fellow of IDICS and received the SEM A. J. Durelli Award for outstanding contributions to DIC.

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